NSLS-II | CFN | Brookhaven National Laboratory
Date: Tuesday, May 22, 2012
Organizer(s): Larry Carr, carr@bnl.gov; co-organizers: Adrian Gozar, agozar@bnl.gov; Matt Sfeir, msfeir@bnl.gov; Eli Stavitski,istavitski@bnl.gov; Lisa Miller, lmiller@bnl.gov
Location: NSLS, Bldg. 725, Seminar Rm.
Description: The infrared spectral range offers a sensitive, non-contacting probe of chemical and electronic properties of materials, but suffers from diffraction effects when attempting to probe structures below 1 micron in size. This includes nanomaterials for energy applications, electronic & polymeric materials and mapping the chemical constituents in biological tissues at the sub-cellular level. Near-field microscopy methods have evolved to where spectra can be produced with continuum sources such as synchrotron radiation. This workshop brings experts in the development of near-field IR for spectroscopic analysis on the nanoscale.